| Title: |
High Temperature Annealing induced recovery of Hot-Carrier degradation in High Performance NPN SiGe HBTs |
| Authors: |
Ioannou, Dimitris P.; Divergilio, Adam |
| Source: |
2024 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS) BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS), 2024 IEEE. :270-273 Oct, 2024 |
| Relation: |
2024 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS) |
| Database: |
IEEE Xplore Digital Library |