Quality Control and Characterization of Engineered Ge Substrates
| Title: | Quality Control and Characterization of Engineered Ge Substrates |
|---|---|
| Authors: | Cho, Jinyoun; Sharma, Rajiv; Vanuytven, Robin; Proost, Priyanka; Tan, Eric; Chapotot, Alexandre; Dessein, Kristof |
| Source: | 2024 IEEE 52nd Photovoltaic Specialist Conference (PVSC) Photovoltaic Specialist Conference (PVSC), 2024 IEEE 52nd. :1075-1079 Jun, 2024 |
| Relation: | 2024 IEEE 52nd Photovoltaic Specialist Conference (PVSC) |
| Database: | IEEE Xplore Digital Library |