| Title: |
BayWatch: Leveraging Bayesian Neural Networks for Hardware Fault Tolerance and Monitoring |
| Authors: |
Hoefer, Julian; Stammler, Matthias; KreB, Fabian; Hotfilter, Tim; Harbaum, Tanja; Becker, Juergen |
| Source: |
2024 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2024 IEEE International Symposium on. :1-6 Oct, 2024 |
| Relation: |
2024 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) |
| Database: |
IEEE Xplore Digital Library |