Minimizing PVT-Variability by Exploiting the Zero Temperature Coefficient (ZTC) for Robust Delay Fault Testing
| Title: | Minimizing PVT-Variability by Exploiting the Zero Temperature Coefficient (ZTC) for Robust Delay Fault Testing |
|---|---|
| Authors: | Jafarzadeh, Hanieh; Klemme, Florian; Reimer, Jan Dennis; Amrouch, Hussam; Hellebrand, Sybille; Wunderlich, Hans-Joachim |
| Source: | 2024 IEEE International Test Conference (ITC) ITC Test Conference (ITC), 2024 IEEE International. :26-30 Nov, 2024 |
| Relation: | 2024 IEEE International Test Conference (ITC) |
| Database: | IEEE Xplore Digital Library |