Themis: Automatic and Efficient Deep Learning System Testing with Strong Fault Detection Capability
| Title: | Themis: Automatic and Efficient Deep Learning System Testing with Strong Fault Detection Capability |
|---|---|
| Authors: | Huang, Dong; Li, Tsz On; Xie, Xiaofei; Cui, Heming |
| Source: | 2024 IEEE 35th International Symposium on Software Reliability Engineering (ISSRE) ISSRE Software Reliability Engineering (ISSRE), 2024 IEEE 35th International Symposium on. :451-462 Oct, 2024 |
| Relation: | 2024 IEEE 35th International Symposium on Software Reliability Engineering (ISSRE) |
| Database: | IEEE Xplore Digital Library |