| Title: |
RON Degradation Mechanisms of ON-Wafer 100-V p-GaN HEMTs Emulating Monolithically Integrated Half-Bridge Circuits |
| Authors: |
Zagni, Nicolo; Modica, Lorenzo; Cioni, Marcello; Cappellini, Giacomo; Castagna, Maria Eloisa; Giorgino, Giovanni; Iucolano, Ferdinando; Verzellesi, Giovanni; Chini, Alessandro |
| Source: |
2024 IEEE 11th Workshop on Wide Bandgap Power Devices & Applications (WiPDA) Wide Bandgap Power Devices & Applications (WiPDA), 2024 IEEE 11th Workshop on. :1-4 Nov, 2024 |
| Relation: |
2024 IEEE 11th Workshop on Wide Bandgap Power Devices & Applications (WiPDA) |
| Database: |
IEEE Xplore Digital Library |