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Towards Unparallelled CMOS-compatible Air-coupled pMUT Performance with 30% Sc-doped AlN through an Analysis of Residual Stress Effects

Title: Towards Unparallelled CMOS-compatible Air-coupled pMUT Performance with 30% Sc-doped AlN through an Analysis of Residual Stress Effects
Authors: Liu, Jihang; Jian, Goh Duan; Ssu-Han Chen, Daniel; Sze Wai, David Choong; Shyam, Trivedi; Ramegowda, Prakasha Chigahalli; Srinivas, Merugu; Huamao, Lin; Xin, Zhang Qing; Chang Hyun Kee, Peter; Das, Amal; Sciarrone, Alessandra; Leotti, Alberto; Giusti, Domenico; Lee, Joshua E.-Y.; Koh, Yul
Source: 2024 IEEE Ultrasonics, Ferroelectrics, and Frequency Control Joint Symposium (UFFC-JS) Ultrasonics, Ferroelectrics, and Frequency Control Joint Symposium (UFFC-JS), 2024 IEEE. :1-4 Sep, 2024
Relation: 2024 IEEE Ultrasonics, Ferroelectrics, and Frequency Control Joint Symposium (UFFC-JS)
Database: IEEE Xplore Digital Library