| Title: |
Advancing Substructure Analysis in Tomograms |
| Authors: |
Rafik, Moh; Mosca, Nicola; Nitti, Massimiliano; Ferraro, Pietro; di Summa, Maria |
| Source: |
2024 IEEE International Conference on Metrology for eXtended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE) Metrology for eXtended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE), 2024 IEEE International Conference on. :475-480 Oct, 2024 |
| Relation: |
2024 IEEE International Conference on Metrology for eXtended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE) |
| Database: |
IEEE Xplore Digital Library |