| Title: |
Exploring the Microcosm: Immersive Tomographic Analysis of Specimens |
| Authors: |
Mosca, Nicola; Di Summa, Maria; Rafik, Moh; Bianco, Vittorio; Patruno, Cosimo; Stella, Ettore |
| Source: |
2024 IEEE International Conference on Metrology for eXtended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE) Metrology for eXtended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE), 2024 IEEE International Conference on. :470-474 Oct, 2024 |
| Relation: |
2024 IEEE International Conference on Metrology for eXtended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE) |
| Database: |
IEEE Xplore Digital Library |