A Comparative Analysis of Radiation Tolerance in Charge-Trap and Floating-Gate 3-D NAND Memory Technologies
| Title: | A Comparative Analysis of Radiation Tolerance in Charge-Trap and Floating-Gate 3-D NAND Memory Technologies |
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| Authors: | Kumar, M.A.; Buddhanoy, M.; Ray, B. |
| Source: | IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 72(4):1077-1085 Apr, 2025 |
| Database: | IEEE Xplore Digital Library |