| Title: |
Origin of Long-Period Electrical Instability in Silicon Fin-Type Quantum Dots |
| Authors: |
Oka, H.; Asai, H.; Kato, K.; Inaba, T.; Shitakata, S.; Iizuka, S.; Chiashi, Y.; Kobayashi, Y.; Yui, H.; Nagano, S.; Murakami, S.; Iba, Y.; Ogura, M.; Nakayama, T.; Koike, H.; Fuketa, H.; Moriyama, S.; Mori, T. |
| Source: |
2024 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2024 IEEE International. :1-4 Dec, 2024 |
| Relation: |
2024 IEEE International Electron Devices Meeting (IEDM) |
| Database: |
IEEE Xplore Digital Library |