| Title: |
Nanoscale Device Modeling Beyond the Ballistic Limit of Transport and Fixed Geometries |
| Authors: |
Luisier, M.; Backman, J.; Cao, J.; Deuschle, L.; Kaniselvan, M.; Lee, Y.; Maeder, A.; Maillou, V.; Mladenovic, M.; Vetsch, N.; Winka, A.; Xia, C. H.; Ziogas, A. N. |
| Source: |
2024 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2024 IEEE International. :1-4 Dec, 2024 |
| Relation: |
2024 IEEE International Electron Devices Meeting (IEDM) |
| Database: |
IEEE Xplore Digital Library |