| Title: |
Unraveling BTI in IGZO Devices: Impact of Device Architecture, Channel Film Deposition Method and Stoichiometry/Phase, and Device Operating Conditions |
| Authors: |
Chasin, A.; Franco, J.; Van Beek, S.; Dekkers, H.; Kruv, A.; Rinaudo, P.; Zhao, Y.; Matsubayashi, D.; Pavel, A.; Wan, Y.; Trivedi, K.; Rassoul, N.; Li, J.; Jiang, Y.; Van Setten, M.; Subhechha, S.; Belmonte, A.; Kaczer, B.; Kar, G. S. |
| Source: |
2024 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2024 IEEE International. :1-4 Dec, 2024 |
| Relation: |
2024 IEEE International Electron Devices Meeting (IEDM) |
| Database: |
IEEE Xplore Digital Library |