| Title: |
Superior Scalability of Advanced Horizontal Channel Flash for Future Generations of 3D Flash Memory |
| Authors: |
Oda, M.; Sakamawari, K.; Seno, S.; Nakata, Y.; Fukuoka, R.; Kusai, H.; Hosotani, K.; Nakanishi, T.; Hagishima, D.; Ishikawa, T.; Ogura, T.; Naito, S.; Kurusu, T.; Mano, S.; Ogikubo, T.; Fujimatsu, M.; Sugimae, K.; Hatakeyama, M.; Inuzuka, Y.; Niki, Y.; Tanaka, R.; Shibata, N.; Nakamura, H.; Fujiwara, M.; Matsuo, K.; Shimojo, Y.; Arai, F.; Kondo, M.; Oki, T.; Kito, M. |
| Source: |
2024 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2024 IEEE International. :1-4 Dec, 2024 |
| Relation: |
2024 IEEE International Electron Devices Meeting (IEDM) |
| Database: |
IEEE Xplore Digital Library |