| Title: |
Deep Learning-Based Image Processing for Defect Detection in Electronic Components Manufacturing |
| Authors: |
Mathivanan, B.; Maruthupandi, J.; Lakshmi, Namala Vijaya; Suvitha, S; Karthik, K.; Swaroop, Anand |
| Source: |
2024 International Conference on Innovative Computing, Intelligent Communication and Smart Electrical Systems (ICSES) Innovative Computing, Intelligent Communication and Smart Electrical Systems (ICSES), 2024 International Conference on. :1-6 Dec, 2024 |
| Relation: |
2024 International Conference on Innovative Computing, Intelligent Communication and Smart Electrical Systems (ICSES) |
| Database: |
IEEE Xplore Digital Library |