Maskify: Precision Detection and Fit Assessment for Mask Compliance
| Title: | Maskify: Precision Detection and Fit Assessment for Mask Compliance |
|---|---|
| Authors: | Pathak, Prakrit; Garg, Ayush; Kumar Chaurasia, Priyesh |
| Source: | 2025 IEEE 6th International Conference on Image Processing, Applications and Systems (IPAS) Image Processing, Applications and Systems (IPAS), 2025 IEEE 6th International Conference on. CFP2540Z-ART:1-4 Jan, 2025 |
| Relation: | 2025 IEEE 6th International Conference on Image Processing, Applications and Systems (IPAS) |
| Database: | IEEE Xplore Digital Library |