Charge Trap Layer Supercharging for Improved Bit Reliability in 3-D NAND Flash Under Proton Irradiation
| Title: | Charge Trap Layer Supercharging for Improved Bit Reliability in 3-D NAND Flash Under Proton Irradiation |
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| Authors: | Breeding, M.L.; Teijeiro, A.E.; Hughart, D.; Young, J.; Black, D.A.; Black, J.D.; Wilcox, E.P. |
| Source: | IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 72(4):1433-1442 Apr, 2025 |
| Database: | IEEE Xplore Digital Library |