| Title: |
Improving On-Wafer Characterization of Sub-THz Devices: A Probe Influence and Crosstalk Study |
| Authors: |
Cheron, J.; Miller, N.C.; Crespo, A.; Williams, D.F.; Jones, R.D.; Elliott, M.; Jargon, J.A.; Gilbert, R.; Jamroz, B.F.; Shell, J.; Bosworth, B.T.; Gebara, E.; Jungwirth, N.R.; Aaen, P.H.; Long, C.J.; Orloff, N.D.; Booth, J.C.; Feldman, A.D. |
| Source: |
IEEE Transactions on Microwave Theory and Techniques IEEE Trans. Microwave Theory Techn. Microwave Theory and Techniques, IEEE Transactions on. 73(6):3144-3155 Jun, 2025 |
| Database: |
IEEE Xplore Digital Library |