State Dependent Threshold Voltage Shift in Irradiated 64-Layer 3-D NAND Memories
| Title: | State Dependent Threshold Voltage Shift in Irradiated 64-Layer 3-D NAND Memories |
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| Authors: | Kumar, M.A.; Chatterjee, I.; Boykin, T.; Ray, B. |
| Source: | IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 72(8):2498-2505 Aug, 2025 |
| Database: | IEEE Xplore Digital Library |