Investigations Into Failure Mechanism of Cascode GaN HEMTs Under Single Pulse Surge Current Stress
| Title: | Investigations Into Failure Mechanism of Cascode GaN HEMTs Under Single Pulse Surge Current Stress |
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| Authors: | Lu, W.; Li, S.; Mao, W.; Ma, Y.; Li, M.; Ma, J.; Ye, R.; Wei, J.; Zhang, L.; Zhang, C.; Liu, S.; Sun, W. |
| Source: | IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 72(6):2891-2897 Jun, 2025 |
| Database: | IEEE Xplore Digital Library |