| Title: |
A Highly Integrable, Modular and Multi-Functional Fault Monitoring Active Gate Driver with Parallel Buffers for a Global Enhanced Reliability of Gen. 3 SiC Power MOSFETs |
| Authors: |
Picot-Digoix, Mathis; Seugnet, Leo; Richardeau, Frederic; Blaquiere, Jean-Marc; Vinnac, Sebastien; Le, Thanh-Long; Azzopardi, Stephane |
| Source: |
2025 IEEE Applied Power Electronics Conference and Exposition (APEC) Applied Power Electronics Conference and Exposition (APEC), 2025 IEEE. :2718-2724 Mar, 2025 |
| Relation: |
2025 IEEE Applied Power Electronics Conference and Exposition (APEC) |
| Database: |
IEEE Xplore Digital Library |