| Title: |
Leakage Current Detection Scheme for Aging Test of 10kV SiC MOSFET Power Module |
| Authors: |
Ding, Peiyang; Zhang, Hong; Yuan, Tianshu; Chen, Qiling; Guo, Jiacheng; Ma, Dingkun; Sun, Peiyuan; Hou, Ting; Wang, Laili |
| Source: |
2025 IEEE Applied Power Electronics Conference and Exposition (APEC) Applied Power Electronics Conference and Exposition (APEC), 2025 IEEE. :2375-2379 Mar, 2025 |
| Relation: |
2025 IEEE Applied Power Electronics Conference and Exposition (APEC) |
| Database: |
IEEE Xplore Digital Library |