Sense and React: Self-Destructive Polymorphic Mechanism Against Voltage Tampered Active Physical Attacks
| Title: | Sense and React: Self-Destructive Polymorphic Mechanism Against Voltage Tampered Active Physical Attacks |
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| Authors: | Roy, S.; Cannon, A.; de la Mata, L.; Yu Acharya, R.; Farheen, T.; Tajik, S.; Forte, D. |
| Source: | IEEE Transactions on Very Large Scale Integration (VLSI) Systems IEEE Trans. VLSI Syst. Very Large Scale Integration (VLSI) Systems, IEEE Transactions on. 33(6):1729-1742 Jun, 2025 |
| Database: | IEEE Xplore Digital Library |