| Title: |
Deep Anomaly Detection with Extended Transformer-Based Model on Tennessee Eastman Process Dataset |
| Authors: |
Schoch, Fabian; Graf, Pascal; Schmieg, Tobias; Wittenberg, Carsten; Lanquillon, Carsten; Stache, Nicolaj C. |
| Source: |
2024 IEEE 19th International Conference on Computer Science and Information Technologies (CSIT) Computer Science and Information Technologies (CSIT), 2024 IEEE 19th International Conference on. :1-4 Oct, 2024 |
| Relation: |
2024 IEEE 19th International Conference on Computer Science and Information Technologies (CSIT) |
| Database: |
IEEE Xplore Digital Library |