| Title: |
Microprocessor Switching Activity Translation to AC Gate Oxide Wearout: Does it Matter? INTEL4 Meteor Lake Chip Activity Case Study |
| Authors: |
Pantisano, Luigi; Joshi, K.; Chbili, Z.; Frantz, E.; Ramey, S.M.; Hicks, J.; Le, H.; Foley, K.M; Pasumarthi, K.; Sebot, J. |
| Source: |
2025 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2025 IEEE International. :1-6 Mar, 2025 |
| Relation: |
2025 IEEE International Reliability Physics Symposium (IRPS) |
| Database: |
IEEE Xplore Digital Library |