| Title: |
Application-based Modeling of I/O Reliability |
| Authors: |
Shroff, M. D.; Satasia, J.; Lu, C.; Xie, K.; Liu, Z. Y.; Zhang, L.; Peng, R.; Jiang, J.; Zhao, W.; Liu, G.; Pavlanin, R.; Kala-Janssen, S.; Ye, R.; Sanchez, H.; Bearden, D.; Le Cam, C.; Patel, A.; Magnella, C.; Richards-Chacon, C. |
| Source: |
2025 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2025 IEEE International. :1-6 Mar, 2025 |
| Relation: |
2025 IEEE International Reliability Physics Symposium (IRPS) |
| Database: |
IEEE Xplore Digital Library |