Novel Linear Model for OFF-State Stress Causing Stand-By Current of Advanced VNAND Chip
| Title: | Novel Linear Model for OFF-State Stress Causing Stand-By Current of Advanced VNAND Chip |
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| Authors: | Park, H.; Kim, G-J.; Kim, N.-J.; Ahn, J.; You, T.; Kang, Y.; Yoon, M.; Lee, S.; Lee, N.-H.; Hwang, S.; Hwang, YC; Ko, SB.; Pae, S. |
| Source: | 2025 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2025 IEEE International. :1-6 Mar, 2025 |
| Relation: | 2025 IEEE International Reliability Physics Symposium (IRPS) |
| Database: | IEEE Xplore Digital Library |