| Title: |
Reliability Performances Tuning in Ge-rich GeSbTe Phase-Change Memory Thanks to Multilayered Ge//GeSbTe Stacks |
| Authors: |
Nguyen, N-A.; Daoudi, O.; Bernard, M.; Fellouh, L.; Tessaire, M.; Sabbione, C.; Saghi, Z.; Monniez, T.; De Camaret, C.; Nolot, E.; Bourgeois, G.; Salvi, A.; Gout, S.; Andrieu, F.; Navarro, G. |
| Source: |
2025 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2025 IEEE International. :1-5 Mar, 2025 |
| Relation: |
2025 IEEE International Reliability Physics Symposium (IRPS) |
| Database: |
IEEE Xplore Digital Library |