| Title: |
Experimental Validation of Buffer Traps-Driven Electric Field Dynamics Governing Breakdown and Leakage Trends in AlGaN/GaN Heterostructures |
| Authors: |
Malik, Rasik Rashid; Karthik, Simran R; Joshi, Vipin; Chaudhuri, Rajarshi Roy; Munshi, M. Ateeb; Mir, Mehak A.; Wani, Saniya Syed; Shrivastava, Mayank |
| Source: |
2025 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2025 IEEE International. :P26.GaN-1-P26.GaN-4 Mar, 2025 |
| Relation: |
2025 IEEE International Reliability Physics Symposium (IRPS) |
| Database: |
IEEE Xplore Digital Library |