Impact of Uncertainty and Non-Idealities in On-Wafer Multiline TRL Calibration on Broadband GaN HEMT Modeling
| Title: | Impact of Uncertainty and Non-Idealities in On-Wafer Multiline TRL Calibration on Broadband GaN HEMT Modeling |
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| Authors: | Shell, Jason; Cheron, Jerome; Hodek, Matthew; Gebara, Edward; Miller, Nicholas C. |
| Source: | 2025 104th ARFTG Microwave Measurement Conference (ARFTG) ARFTG Microwave Measurement Conference (ARFTG), 2025 104th. :1-4 Jan, 2025 |
| Relation: | 2025 104th ARFTG Microwave Measurement Conference (ARFTG) |
| Database: | IEEE Xplore Digital Library |