Enhanced Behavioral Modeling for Short-Circuit Ruggedness Analysis in GaN-Based Half-Bridge
| Title: | Enhanced Behavioral Modeling for Short-Circuit Ruggedness Analysis in GaN-Based Half-Bridge |
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| Authors: | Palazzo, S.; Pereira, T.; Pascal, Y.; Busatto, G.; Liserre, M. |
| Source: | IEEE Journal of Emerging and Selected Topics in Power Electronics IEEE J. Emerg. Sel. Topics Power Electron. Emerging and Selected Topics in Power Electronics, IEEE Journal of. 13(6):7662-7678 Dec, 2025 |
| Database: | IEEE Xplore Digital Library |