A Multi-Step Algorithm to Increase Measurement Accuracy of mm-Wave BIST Using Periodic Structures
| Title: | A Multi-Step Algorithm to Increase Measurement Accuracy of mm-Wave BIST Using Periodic Structures |
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| Authors: | Rajbharti, Noah; Chacon, Esteban; Avci, Muslum Emir; Kitchen, Jennifer; Ozev, Sule |
| Source: | 2025 IEEE 43rd VLSI Test Symposium (VTS) VLSI Test Symposium (VTS), 2025 IEEE 43rd. :1-5 Apr, 2025 |
| Relation: | 2025 IEEE 43rd VLSI Test Symposium (VTS) |
| Database: | IEEE Xplore Digital Library |