Analog Test Bus Structure for Wide-Bandwidth High-Frequency Measurements
| Title: | Analog Test Bus Structure for Wide-Bandwidth High-Frequency Measurements |
|---|---|
| Authors: | Ledingham, William D.; Roberts, Gordon W. |
| Source: | 2025 IEEE International Symposium on Circuits and Systems (ISCAS) Circuits and Systems (ISCAS), 2025 IEEE International Symposium on. :1-5 May, 2025 |
| Relation: | 2025 IEEE International Symposium on Circuits and Systems (ISCAS) |
| Database: | IEEE Xplore Digital Library |