Robust Defect Detection for Phase-Locked Loops using All-Digital Built-In Self-Test (BIST) Circuitry
| Title: | Robust Defect Detection for Phase-Locked Loops using All-Digital Built-In Self-Test (BIST) Circuitry |
|---|---|
| Authors: | Sekyere, Michael; Saikiran, Marampally; Butler, Rob; Adams, Reed; Chen, Degang |
| Source: | 2025 IEEE International Symposium on Circuits and Systems (ISCAS) Circuits and Systems (ISCAS), 2025 IEEE International Symposium on. :1-5 May, 2025 |
| Relation: | 2025 IEEE International Symposium on Circuits and Systems (ISCAS) |
| Database: | IEEE Xplore Digital Library |