| Title: |
Automatic PSP MOSFET model card extraction powered by deep learning |
| Authors: |
Rodriguez, Alba Ordonez; Gilibert, Fabien; Paolini, Francois; Gerard, Alan; Vincent, Elouan; Derrier, Nicolas; Quoirin, Matthieu; Urard, Pascal; Samuel, John; Cellier, Remy; Labrak, Lioua; Abouchi, Nacer |
| Source: |
2025 IEEE 37th International Conference on Microelectronic Test Structures (ICMTS) Microelectronic Test Structures (ICMTS), 2025 IEEE 37th International Conference on. :1-4 Mar, 2025 |
| Relation: |
2025 IEEE 37th International Conference on Microelectronic Test Structures (ICMTS) |
| Database: |
IEEE Xplore Digital Library |