| Title: |
Hysteresis-Induced Neuromorphic Behavior in 180nm Bulk PMOS Devices at 3K |
| Authors: |
Imroze, Fiheon; Yalagala, Bhavani; Ahmad, Meraj; Elsayed, Mostafa; Graham, Robert; Colletta, Giuseppe; Heidari, Hadi; Weides, Martin |
| Source: |
2025 IEEE 37th International Conference on Microelectronic Test Structures (ICMTS) Microelectronic Test Structures (ICMTS), 2025 IEEE 37th International Conference on. :1-4 Mar, 2025 |
| Relation: |
2025 IEEE 37th International Conference on Microelectronic Test Structures (ICMTS) |
| Database: |
IEEE Xplore Digital Library |