| Title: |
Robust Measurement and De-embedding Techniques of Si/SiGe HBT Devices up to 500 GHz |
| Authors: |
Billy, Philippine; Varghese, Jojo; De Matos, Magali; Celi, Didier; Derrier, Nicolas; Gauthier, Alexis; Chevalier, Pascal; Zimmer, Thomas; Fregonese, Sebastien |
| Source: |
2025 IEEE 24th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems (SiRF) Silicon Monolithic Integrated Circuits in RF Systems (SiRF), 2025 IEEE 24th Topical Meeting on. :53-56 Jan, 2025 |
| Relation: |
2025 IEEE 24th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems (SiRF) |
| Database: |
IEEE Xplore Digital Library |