| Title: |
Digital Defect Oriented Test Method for Phase Locked Loops with High Coverage |
| Authors: |
Sekyere, Michael; Saikiran, Marampally; Bonsu, Godfred; Tamakloe, Kelvin W.; Butler, Rob; Adams, Reed; Chen, Degang |
| Source: |
2025 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Instrumentation and Measurement Technology Conference (I2MTC), 2025 IEEE International. :1-6 May, 2025 |
| Relation: |
2025 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) |
| Database: |
IEEE Xplore Digital Library |