Statistical Analysis of the Rotation Induced Decay of the Contrast in an Onboard Atom Interferometer
| Title: | Statistical Analysis of the Rotation Induced Decay of the Contrast in an Onboard Atom Interferometer |
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| Authors: | Kaczmarczuk, B.; Gomes Baptista, J.; Merlet, S.; Sidorenkov, L.A.; Beaufils, Q.; Pereira Dos Santos, F. |
| Source: | IEEE Sensors Journal IEEE Sensors J. Sensors Journal, IEEE. 25(16):30889-30896 Aug, 2025 |
| Database: | IEEE Xplore Digital Library |