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Intelligent Feedback Analytics- Sentiment Analysis and Defect Detection in Elevating Product Quality and Customer Experience

Title: Intelligent Feedback Analytics- Sentiment Analysis and Defect Detection in Elevating Product Quality and Customer Experience
Authors: Padoor, Veda; P, Tharun Kumar; Pani, Y L Krishna; Bhalke, Vaibhavi; Kasturi, Nivedita
Source: 2025 11th International Conference on Communication and Signal Processing (ICCSP) Communication and Signal Processing (ICCSP), 2025 11th International Conference on. :954-959 Jun, 2025
Relation: 2025 11th International Conference on Communication and Signal Processing (ICCSP)
Database: IEEE Xplore Digital Library