Origin of Unique Low-Frequency Noise Characteristics in Ultra-Thin InGaZnSnO Thin-Film Transistors
| Title: | Origin of Unique Low-Frequency Noise Characteristics in Ultra-Thin InGaZnSnO Thin-Film Transistors |
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| Authors: | Jiang, Y.; Chen, K.; Su, R.; Yang, L.; Gao, D.; Cheng, R.; Li, Y.; Li, J.; Zhang, R. |
| Source: | IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 46(10):1789-1792 Oct, 2025 |
| Database: | IEEE Xplore Digital Library |