Calibration of Electron Microscopes Through Deep Learning and Bayesian Optimization
| Title: | Calibration of Electron Microscopes Through Deep Learning and Bayesian Optimization |
|---|---|
| Authors: | Hulst, J.S.v.; van Zuijlen, R.A.C.; Javaheri, N.; Diephuis, M.; Antunes, D.J.; Heemels, W.P.M.H. |
| Source: | IEEE Access Access, IEEE. 13:137291-137302 2025 |
| Database: | IEEE Xplore Digital Library |