| Title: |
A Digital SRAM Modeling for Cell-Aware Testing and Test Algorithms Evaluation |
| Authors: |
Ronga, D.; Xhafa, X.; Faehn, E.; Girard, P.; Vayssade, T.; Virazel, A. |
| Source: |
2025 IEEE 31st International Symposium on On-Line Testing and Robust System Design (IOLTS) On-Line Testing and Robust System Design (IOLTS), 2025 IEEE 31st International Symposium on. :1-5 Jul, 2025 |
| Relation: |
2025 IEEE 31st International Symposium on On-Line Testing and Robust System Design (IOLTS) |
| Database: |
IEEE Xplore Digital Library |