| Title: |
Experiment and Simulation Study of Single-Event Burnout in GaN Event-Triggering HEMTs |
| Authors: |
Sun, Ruize; Wu, Renjie; Wang, Xiaoming; Xia, Yun; Liu, Chao; Chen, Wanjun; Zhang, Bo |
| Source: |
2025 37th International Symposium on Power Semiconductor Devices and ICs (ISPSD) Power Semiconductor Devices and ICs (ISPSD), 2025 37th International Symposium on. :221-224 Jun, 2025 |
| Relation: |
2025 37th International Symposium on Power Semiconductor Devices and ICs (ISPSD) |
| Database: |
IEEE Xplore Digital Library |