| Title: |
Investigation into the Aging Mechanisms of a SiC-Based Power MOSFET by Thermal and Thermomechanical Analysis |
| Authors: |
dAmbrosio, Moreno; Tripodi, Chiara; Garesci, Francesca; Cosio, Daniele; Bonanno, Domenico; Rundo, Francesco; Messina, Angelo Alberto; Imbruglia, Antonio; Calabretta, Michele; Patane, Salvatore |
| Source: |
2025 IEEE International Workshop on Metrology for Automotive (MetroAutomotive) Metrology for Automotive (MetroAutomotive), 2025 IEEE International Workshop on. :168-172 Jun, 2025 |
| Relation: |
2025 IEEE International Workshop on Metrology for Automotive (MetroAutomotive) |
| Database: |
IEEE Xplore Digital Library |