| Title: |
Threshold Voltage Bias Temperature Instability of RF MIS-HEMTs and Schottky HEMTs Under Semi-On State Stress |
| Authors: |
Tsai, M.; Kuo, Y.; Yu, H.; de Almeida Braga, N.; Yang, Y.; Lin, T.; Fang, J.; Lin, W.; Navolotskaia, A.; O'Sullivan, B.; Rathi, A.; Gupta, A.; Yadav, S.; Alian, A.; Peralagu, U.; Parvais, B.; Collaert, N.; Wu, T. |
| Source: |
IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 72(10):5359-5365 Oct, 2025 |
| Database: |
IEEE Xplore Digital Library |