Degradation of 2.4-kV Ga₂O₃ Schottky Barrier Diode at High Temperatures Up to 500°C
| Title: | Degradation of 2.4-kV Ga₂O₃ Schottky Barrier Diode at High Temperatures Up to 500°C |
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| Authors: | Ellis, H.; Jia, W.; Rahaman, I.; Hillas, A.; Li, B.; Scarpulla, M.A.; Sensale Rodriguez, B.; Fu, K. |
| Source: | IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 72(10):5372-5378 Oct, 2025 |
| Database: | IEEE Xplore Digital Library |