Suppressing Phase Transition in Antiferroelectric Hf0.2Zr0.8O2 Films During Electrical Cycling by Thickness Scaling
| Title: | Suppressing Phase Transition in Antiferroelectric Hf0.2Zr0.8O2 Films During Electrical Cycling by Thickness Scaling |
|---|---|
| Authors: | Qian, H.; Shen, R.; Ma, M.; Zhang, M.; Li, X.; Ding, Y.; Gu, J.; Song, X.; Cheng, R.; Liu, Y.; Jin, C.; Chen, J.; Hao, Y.; Han, G. |
| Source: | IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 72(11):5948-5952 Nov, 2025 |
| Database: | IEEE Xplore Digital Library |