Exploring Short-Circuit Failure Mechanism of Cascode GaN HEMT
| Title: | Exploring Short-Circuit Failure Mechanism of Cascode GaN HEMT |
|---|---|
| Authors: | Li, S.; Wang, Q.; Lu, W.; Wu, L.; Li, Y.; Zhu, T.; Ye, R.; Ma, J.; Wei, J.; Zhang, L.; Liu, S.; Sun, W. |
| Source: | IEEE Transactions on Power Electronics IEEE Trans. Power Electron. Power Electronics, IEEE Transactions on. 41(3):3161-3164 Mar, 2026 |
| Database: | IEEE Xplore Digital Library |