A Dual Deep Neural Network Approach for Discriminating Internal Faults and Inrush Currents in Transformers Under CT Saturation
| Title: | A Dual Deep Neural Network Approach for Discriminating Internal Faults and Inrush Currents in Transformers Under CT Saturation |
|---|---|
| Authors: | Key, S.; Leap, S.; Yoon, S.; Lee, H.; Nam, S. |
| Source: | IEEE Access Access, IEEE. 13:178492-178504 2025 |
| Database: | IEEE Xplore Digital Library |